Tobias A. de Jong,
J. (Johannes) Jobst,
Version 1 of Dataset published 2019 via 4TU.Centre for Research Data
This dataset contains a Low Energy Electron Microscopy dataset consisting of raw data of both a dark field and a bright field spectroscopic image series of a region of few layer graphene on Silicon Carbide. Additionally it contains calibration data: a dark count dataset, a HDR calibration dataset and two curves showcasing the difference between HDR and non-HDR imaging.