10.4121/uuid:7f672638-66f6-4ec3-a16c-34181cc45202

URL

Metadata

Data underlying the paper: Quantitative analysis of spectroscopic Low Energy Electron Microscopy Data Dataset

Tobias A. de Jong, J. (Johannes) Jobst,
This dataset contains a Low Energy Electron Microscopy dataset consisting of raw data of both a dark field and a bright field spectroscopic image series of a region of few layer graphene on Silicon Carbide. Additionally it contains calibration data: a dark count dataset, a HDR calibration dataset and two curves showcasing the difference between HDR and non-HDR imaging.

Citation